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- Title:
Impact of fast-recovering NBTI degradation on stability of large-scale SRAM arrays
- Author(s):
- Drapatz, S.; Hofmann, K.; Georgakos, G.; Schmitt-Landsiedel, D.
- Pages contribution:
- 146 -149
- Keywords:
- NBTI degradation; recovering NBTI; classical static noise margin; fast stability analysis; large-scale SRAM arrays; low power technology; negative bias temperature instability; read margin analysis; single-cell simulation; SRAM chips; circuit simulation; integrated circuit noise; low-power electronics; thermal stability
- Book / Congress title:
- European Solid-State Device Research Conference
- Year:
- 2010
- Month:
- sep
- Bookseries title:
- ESSDERC Proceedings
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