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- Titel:
Impact of fast-recovering NBTI degradation on stability of large-scale SRAM arrays
- Autor(en):
- Drapatz, S.; Hofmann, K.; Georgakos, G.; Schmitt-Landsiedel, D.
- Seitenangaben Beitrag:
- 146 -149
- Stichworte:
- NBTI degradation; recovering NBTI; classical static noise margin; fast stability analysis; large-scale SRAM arrays; low power technology; negative bias temperature instability; read margin analysis; single-cell simulation; SRAM chips; circuit simulation; integrated circuit noise; low-power electronics; thermal stability
- Kongress- / Buchtitel:
- European Solid-State Device Research Conference
- Jahr:
- 2010
- Monat:
- sep
- Serientitel:
- ESSDERC Proceedings
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