Correctable Erasure Patterns in Product Topologies

Holzbaur, Lukas; Puchinger, Sven; Yaakobi, Eitan; Wachter-Zeh, Antonia

doi:10.1109/isit45174.2021.9518208

Document type:: Konferenzbeitrag
Author(s):: Holzbaur, Lukas; Puchinger, Sven; Yaakobi, Eitan; Wachter-Zeh, Antonia
Title:: Correctable Erasure Patterns in Product Topologies
Book / Congress title:: 2021 IEEE International Symposium on Information Theory (ISIT)
Publisher:: IEEE
Date of publication:: 12.07.2021
Year:: 2021
Fulltext / DOI:: doi:10.1109/isit45174.2021.9518208
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