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- Author(s):
- Thibault, P.; Dierolf, M.; Menzel, A.; Bunk, O.; David, C.; Pfeiffer, F.
- Title:
- High-Resolution Scanning X-ray Diffraction Microscopy
- Journal title:
- Science
- Year:
- 2008
- Journal volume:
- 321
- Journal issue:
- 5887
- Pages contribution:
- 379-382
- Fulltext / DOI:
- doi:10.1126/science.1158573
- Publisher:
- American Association for the Advancement of Science (AAAS)
- Date of publication:
- 18.07.2008
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