Magnetic profiles of FM/AF/FM trilayers (FM=ferromagnet, AF=antiferromagnet), as a function of AF thickness t have been investigated by bulk magnetization and polarized neutron reflectivity measurements. DC magnetization results show a t-dependence of the magnetization reversal. From the analysis of polarized neutron reflectivity in conjunction with the DC magnetization we conclude that the thickness dependence of magnetization reversal is a direct consequence of domain wall formation across NiO.     «

Magnetic profiles of FM/AF/FM trilayers (FM=ferromagnet, AF=antiferromagnet), as a function of AF thickness t have been investigated by bulk magnetization and polarized neutron reflectivity measurements. DC magnetization results show a t-dependence of the magnetization reversal. From the analysis of polarized neutron reflectivity in conjunction with the DC magnetization we conclude that the thickness dependence of magnetization reversal is a direct consequence of domain wall formation across NiO...     »