- Title:
{Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed}
- Author(s):
- Tabacaru, Bogdan Andrei; Chaari, Moomen; Ecker, Wolfgang; Kruse, Thomas; Novello, Cristiano
- Journal title:
- ERCIM/EWICS/ARTEMIS Workshop on ``Dependable Embedded and Cyber-physical Systems and Systems-of-Systems'' (DECSoS'16)
- Year:
- 2016
- Pages contribution:
- 1--13
- Fulltext / DOI:
- doi:10.1007/978-3-319-45480-1_12
- BibTeX