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- Title:
FinFET Based Product Performance: Modeling and Evaluation of Standard Cells in FinFET Technologies
- Author(s):
- Karapetyan, Shushanik; Kleeberger, Veit B.; Schlichtmann, Ulf
- Journal title:
- Microelectronics Reliability
- Year:
- 2016
- Journal volume:
- 61
- Month:
- jun
- Pages contribution:
- 30-34
- Fulltext / DOI:
- doi:10.1016/j.microrel.2015.12.039
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