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Titel:

Scanning Probe Microscopy and Grazing-Incidence Small-Angle Scattering as Complementary Tools for the Investigation of Polymer Films and Surfaces

Dokumenttyp:
Buchbeitrag
Autor(en):
Müller-Buschbaum, Peter; Körstgens, Volker
Abstract:
The real-space analysis, based on scanning probe microscopy (SPM) techniques and the advanced scattering technique grazing-incidence small-angle scattering (GISAS), are complementary tools for the structural analysis of nanostructures. GISAS experiments can be performed with X-rays, named grazing-incidence small-angle X-ray scattering (GISAXS) and with neutrons, denoted GISANS, respectively. On selected examples of polymer films and surfaces, these complementarities are illustrated. Master curve...     »
Seitenangaben Beitrag:
101--134
Herausgeber:
Bhushan, Bharat
Buchtitel:
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Verlag / Institution:
Springer Berlin Heidelberg
Verlagsort:
Berlin, Heidelberg
Jahr:
2011
Print-ISBN:
978-3-642-10497-8
DOI:
doi:10.1007/978-3-642-10497-8_4
WWW:
https://doi.org/10.1007/978-3-642-10497-8_4
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