- Document type:
- Konferenzbeitrag
- Author(s):
- Holzbaur, Lukas; Puchinger, Sven; Yaakobi, Eitan; Wachter-Zeh, Antonia
- Title:
- Correctable Erasure Patterns in Product Topologies
- Book / Congress title:
- 2021 IEEE International Symposium on Information Theory (ISIT)
- Publisher:
- IEEE
- Date of publication:
- 12.07.2021
- Year:
- 2021
- Fulltext / DOI:
- doi:10.1109/isit45174.2021.9518208
BibTeX