Login
- Title:
Disruption Evaluation in End-to-End Semiconductor Supply Chains via Interpretable Machine Learning
- Document type:
- Konferenzbeitrag
- Author(s):
- Jaenichen, F.-M.; Liepold, C. J.; Ismail, A.; Schiffer, M.; Ehm, H.
- Non-TUM Co-author(s):
- ja
- Cooperation:
- national
- Intellectual Contribution:
- Contribution to Practice
- Book / Congress title:
- 10th IFAC Conference on Manufacturing Modelling, Management and Control MIM 2022
- Congress (additional information):
- Nantes, France
- Year:
- 2022
- Month:
- Jun
- Fulltext / DOI:
- doi:doi.org/10.1016/j.ifacol.2022.09.479
- Key publication:
- Nein
- Peer reviewed:
- Ja
- International:
- Ja
- Commissioned:
- not commissioned
- Technology:
- Ja
- Interdisciplinarity:
- Ja
- Mission statement:
- ;
- Ethics and Sustainability:
- Nein
BibTeX