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- Title:
X‐ray Grating Interferometry at ESRF: Applications and Recent Technical Developments
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Weitkamp, T.; Zanette, I.; Schulz, G.; Bech, M.; Rutishauser, S.; Lang, S.; Donath, T.; Tapfer, A.; Deyhle, H.; Bernard, P.; Valade, J.‐P.; Reznikova, E.; Kenntner, J.; Mohr, J.; Müller, B.; Pfeiffer, F.; David, C.; Baruchel, J.
- Journal title:
- AIP Conference Proceedings
- Year:
- 2011
- Journal volume:
- 1365
- Pages contribution:
- 28-31
- Fulltext / DOI:
- doi:10.1063/1.3625297
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