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Author(s):
Fürtig, Andreas; Steinhorst, Sebastian; Hedrich, Lars 
Title:
Feature-Based State Space Coverage Metric for Analog Circuit Verification 
Pages contribution:
83-101 
Editor:
Fummi, Franco; Wille, Robert 
Book title:
Languages, Design Methods, and Tools for Electronic System Design: Selected Contributions from FDL 2016 
Publisher:
Springer International Publishing 
Year:
2018 
Month:
Jan 
Print-ISBN:
978-3-319-62920-9