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Title:

Feature-Based State Space Coverage Metric for Analog Circuit Verification

Author(s):
Fürtig, Andreas; Steinhorst, Sebastian; Hedrich, Lars
Pages contribution:
83-101
Editor:
Fummi, Franco; Wille, Robert
Book title:
Languages, Design Methods, and Tools for Electronic System Design: Selected Contributions from FDL 2016
Publisher:
Springer International Publishing
Year:
2018
Month:
Jan
Print-ISBN:
978-3-319-62920-9
DOI:
doi:10.1007/978-3-319-62920-9_5
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