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Title:

Locked out by Latch-up? An Empirical Study on Laser Fault Injection into Arm Cortex-M Processors

Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Selmke, Bodo and Zinnecker, Kilian and Koppermann, Philipp and Miller, Katja and Heyszl, Johann and Sigl, Georg
Abstract:
Laser-based fault injection (LFI) is considered as one of the most powerful tools for active attacks against integrated circuits. However, only few empirical results are published for LFI into modern low-power microcontrollers with current process technologies. To fill this gap, we investigate LFI in four Cortex-M microcontrollers from different manufacturers: ST Microelectronics, NXP and Infineon. We note that those controllers differ from the ones used in high-security smartcard devices bu...     »
Keywords:
Laser fault injection, Latch-up, Cortex-M
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2018, Amsterdam, The Netherlands, September 13, 2018
Congress (additional information):
Amsterdam, The Netherlands
Date of congress:
13.09.2018
Year:
2018
Quarter:
3. Quartal
Year / month:
2018-09
Month:
Sep
Pages:
7--14
Fulltext / DOI:
doi:10.1109/FDTC.2018.00010
WWW:
https://doi.org/10.1109/FDTC.2018.00010
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