Data repository - Subcritical crack growth and progressive failure in Carrara marble under wet and dry conditions

Strain monitoring using electrical resistance strain gauges (SGD, 6 mm, 350 Ω, precision 10-5, full Wheatstone bridges) glued 2 mm below the notch tip of a total of eight samples using X60 glue (HBM) and covered with an acid-free silicon sealant (SG250, HBM). On sample M1-M5 strain gauges were mounted on one side, on sample M6-M8 on both sides below the notch. Data was captured using a standard resistance acquisition system (Spider-8, HBM) with a sampling rate of 1Hz. Measurements were zeroed and started while the samples were still in a neutral stress position. Ambient temperature and humidity were monitored with a data logger (Onset HOBO) with sensors positioned within a 3 m radius of the testing frames.     «

Strain monitoring using electrical resistance strain gauges (SGD, 6 mm, 350 Ω, precision 10-5, full Wheatstone bridges) glued 2 mm below the notch tip of a total of eight samples using X60 glue (HBM) and covered with an acid-free silicon sealant (SG250, HBM). On sample M1-M5 strain gauges were mounted on one side, on sample M6-M8 on both sides below the notch. Data was captured using a standard resistance acquisition system (Spider-8, HBM) with a sampling rate of 1Hz. Measurements were zeroed an...     »