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Titel:

Reciprocal Space Mapping of Magnetic Order in Thick Epitaxial {{MnSi}} Films

Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Wiedemann, B.; Chacon, A.; Zhang, S. L.; Khaydukov, Y.; Hesjedal, T.; Soltwedel, O.; Keller, T.; M̈uhlbauer, S.; Adams, T.; Halder, M.; Pfleiderer, C.; B̈oni, P.
Abstract:
We report grazing incidence small angle neutron scattering (GISANS) and complementary off-specular neutron reflectometry (OSR) of the magnetic order in a single-crystalline epitaxial MnSi film on Si(111) in the thick film limit. Providing a means of direct reciprocal space mapping, GISANS and OSR reveal a magnetic modulation perpendicular to the films under magnetic fields parallel and perpendicular to the film, where additional polarized neutron reflectometry (PNR) and magnetization measurement...     »
Stichworte:
Condensed Matter - Strongly Correlated Electrons,Condensed Matter - Materials Science,Condensed Matter - Mesoscale and Nanoscale Physics
Zeitschriftentitel:
arXiv:1710.00544 [cond-mat]
Jahr:
2017
Monat:
oct
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