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Title:

Online Reliability Testing for PUF Key Derivation

Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Hiller, Matthias and Önalan, Aysun Gurur and Sigl, Georg and Bossert, Martin
Pages contribution:
8 pages
Abstract:
Physical Unclonable Functions (PUFs) measure manufacturing variations inside integrated circuits to derive internal secrets during run-time and avoid to store secrets permanently in non-volatile memory. PUF responses are noisy such that they require error correction to generate reliable cryptographic keys. To date, when needed one single key is reproduced in the field and always used, regardless of its reliability. In this work, we compute online reliability information for a reproduced key a...     »
Keywords:
Physical Unclonable Functions; Syndrome Coding; Secret Key Derivation; Coding Theory.
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
6th International Workshop on Trustworthy Embedded Devices TrustED 2016
Congress (additional information):
Vienna, Austria
Date of congress:
10/2016
Year:
2016
Quarter:
4. Quartal
Year / month:
2016-10
Month:
Oct
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1145/2995289.2995293
WWW:
http://doi.acm.org/10.1145/2995289.2995293
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