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Title:

{Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed}

Author(s):
Tabacaru, Bogdan Andrei; Chaari, Moomen; Ecker, Wolfgang; Kruse, Thomas; Novello, Cristiano
Journal title:
ERCIM/EWICS/ARTEMIS Workshop on ``Dependable Embedded and Cyber-physical Systems and Systems-of-Systems'' (DECSoS'16)
Year:
2016
Pages contribution:
1--13
Fulltext / DOI:
doi:10.1007/978-3-319-45480-1_12
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