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Titel:

{I}n situ measurement of aging-induced performance degradation in digital circuits

Autor(en):
Aryan, N. P.; Funke, C.; Barsgfrede, J.; Yilmaz, C.; Schmitt-Landsiedel, D.; Georgakos, G.
Stichworte:
circuit reliability; digital circuits; time-digital conversion; timing; PVTA; TDC; aging induced performance degradation; aging mechanisms; circuit reliability status; digital circuits; functional failure; functional paths; in situ timing monitors; intra-die variations; measurement data analysis; process voltage temperature and aging; time to digital converter; timing behavior; timing properties; timing violations; Aging; Monitoring; Stress; Stress measurement; Temperature measurement; Temperatu...     »
Kongress- / Buchtitel:
2016 21th IEEE European Test Symposium (ETS)
Jahr:
2016
Monat:
May
Seiten:
1-2
Volltext / DOI:
doi:10.1109/ETS.2016.7519285
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