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Title:

Tracking Error Modeling in Presence of Satellite Imperfections

Document type:
Konferenzbeitrag
Author(s):
Vergara, M.; Sgammini, M.; Zhu, Y.; Thoelert, S.; Antreich, F.
Book / Congress title:
ION International Technical Meeting
Congress (additional information):
San Diego, CA, USA
Year:
2014
Year / month:
2014-01
Month:
January
Language:
en
TUM Institution:
Institute for Circuit Theory and Signal Processing
Format:
text
Ingested:
02.07.2014
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