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Document type:
Konferenzbeitrag 
Author(s):
Erol Koser, Sebastian Krösche, Walter Stechele 
Title:
Integrated Soft Error Resilience and Self-Test 
Keywords:
RELY 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) 2016 
Date of congress:
September 26-28 
Year:
2016 
Year / month:
2016-09 
TUM Institution:
Lehrstuhl für Integrierte Systeme