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Document type:
Konferenzbeitrag 
Author(s):
Erol Koser, Walter Stechele 
Title:
Tackling Long Duration Transients in Sequential Logic 
Keywords:
RELY 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
IEEE Int. Symp. on On-Line Testing and Robust System Design (IOLTS) 2016 
Date of congress:
July 4-6 
Year:
2016 
Year / month:
2016-07 
TUM Institution:
Lehrstuhl für Integrierte Systeme