User: Guest  Login
Document type:
Konferenzbeitrag 
Author(s):
David May, Walter Stechele 
Title:
Voltage Over-Scaling in Sequential Circuits for Approximate Computing 
Keywords:
Soft Error Rate Estimation 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
Design &Technology of Integrated Systems in Nanoscale Era 
Date of congress:
April 12-14 
Year:
2016 
Year / month:
2016-04 
TUM Institution:
Lehrstuhl für Integrierte Systeme