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Document type:
Konferenzbeitrag 
Contribution type:
Textbeitrag / Aufsatz 
Author(s):
David May, Walter Stechele 
Title:
Improving the Significance of Probabilistic Circuit Fault Emulations 
Keywords:
Soft Error Rate Estimation, RELY 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
20th IEEE International On-Line Testing Symposium (IOLTS) 
Year:
2014 
Year / month:
2014-07 
Month:
Jul 
Language:
en 
TUM Institution:
Lehrstuhl für Integrierte Systeme