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Document type:
Zeitschriftenaufsatz 
Author(s):
Nyberg, Ralph and Heyszl, Johann and Rabe, Dirk and Sigl, Georg 
Title:
Closing the gap between speed and configurability of multi-bit fault emulation environments for security and safety–critical designs 
Abstract:
Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount of multi-bit fault occurrences, e.g., during fault attacks against cryptographic implementations. Therefore, multi-bit fault injection becomes more important during security and safety verification. Fault injection techniques which are applicable during the development cycle of a device are based on either software implementations, e.g. formal methods and simulations, or fault emulation environment...    »
 
Keywords:
FPGA-based fault emulation; Multi-bit faults; Performance optimization; Configurability; Result evaluation 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Journal title:
Microprocessors and Microsystems 
Year:
2015 
Year / month:
2015-05 
Quarter:
2. Quartal 
Month:
May 
Reviewed:
ja 
Language:
en