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Document type:
Konferenzbeitrag 
Contribution type:
Vortrag / Präsentation 
Author(s):
Specht, Robert and Heyszl, Johann and Sigl, Georg 
Title:
Investigating Measurement Methods for High-Resolution Electromagnetic Field Side-Channel Analysis 
Abstract:
Recent publications have emphasized the power of high-resolution, low-distance EM measurements for side channel analysis. In this paper, we investigate several aspects of such measurements, e.g. different coil-diameters, probe-to-die distances, bandwidths and measurement resolutions. We use an FPGAbased implementation of an AES s-box as device under test and perform measurements of the magnetic near-field. Using the peak amplitude of the magnetic near-field and the Pearson correlation coefficien...    »
 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
International Symposium on Integrated Circuits (ISIC) 
Congress (additional information):
Singapore 
Year:
2014 
Quarter:
4. Quartal 
Year / month:
2014-12 
Month:
Dec 
Reviewed:
ja 
Language:
en