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Document type:
Konferenzbeitrag 
Contribution type:
Vortrag / Präsentation 
Author(s):
Manich, Salvador and Wamser, Markus and Sigl, Georg 
Title:
Improving the Security of Scan Path Test using Differential Chains 
Abstract:
In this paper we present a new scan-path structure in order to improve the security of systems including a scan-path, which normally introduces a security critical information channel into a design. With this new structure we maintain testability as in a scan design and security like in a design without scan path. The structure, named differential scan-path (DiSP), divides the internal state of the scan-path in two sections. During shifting out, only the subtraction of the two sections is prov...    »
 
Keywords:
security, testability, scan-based attack, scanpath, smartcard, BILBO 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
TRUDEVICE 2013 
Congress (additional information):
Avignon, Frankreich 
Year:
2013 
Year / month:
2013-05 
Month:
May 
Reviewed:
ja 
Language:
en