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Title:

Spatial and temporal deep learning for defect detection with lock-in thermography

Document type:
Zeitschriftenaufsatz
Author(s):
Schmid, S.; Reinhardt, J.; Grosse, C.U.
Abstract:
Lock-in thermography is a common non-destructive testing method for the investigation of subsurface defects in thermal conductive materials. The advantages of this method are that it is contact free and large areas can be investigated. However, in comparison to other NDT techniques (e.g., X-ray computed tomography), the resolution is lower. In order to achieve cost savings, automating the evaluation of lock-in thermography data is of great interest. To this end, various data evaluation methods h...     »
Keywords:
Spatial and temporal deep learning, Lock-in thermography, Probability of detection, Adhesive bonds
Journal title:
NDT & E International
Year:
2024
Journal volume:
Vol. 143, 103063
Year / month:
2024-04
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1016/j.ndteint.2024.103063
WWW:
https://doi.org/10.1016/j.ndteint.2024.103063
E-ISSN:
0963-8695
Date of publication:
02.02.2024
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