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- Author(s):
- Rutishauser, Simon; Zanette, Irene; Weitkamp, Timm; Donath, Tilman; David, Christian
- Title:
- At-wavelength characterization of refractive x-ray lenses using a two-dimensional grating interferometer
- Journal title:
- Appl. Phys. Lett.
- Year:
- 2011
- Journal volume:
- 99
- Journal issue:
- 22
- Pages contribution:
- 221104
- Fulltext / DOI:
- doi:10.1063/1.3665063
- Publisher:
- AIP Publishing
- Date of publication:
- 01.01.2011
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