X‐ray Stain Localization with Near‐Field Ptychographic Computed Tomography

Title:: X‐ray Stain Localization with Near‐Field Ptychographic Computed Tomography
Document type:: Zeitschriftenaufsatz
Author(s):: Taphorn, Kirsten; Busse, Madleen; Brantl, Johannes; Günther, Benedikt; Diaz, Ana; Holler, Mirko; Dierolf, Martin; Mayr, Doris; Pfeiffer, Franz; Herzen, Julia
Journal title:: Advanced Science
Year:: 2022
Pages contribution:: 2201723
Fulltext / DOI:: doi:10.1002/advs.202201723
Publisher:: Wiley
E-ISSN:: 2198-38442198-3844
Date of publication:: 24.06.2022
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