Login
- Title:
X-Ray Diffraction Microscopy
- Author(s):
- Thibault, Pierre; Elser, Veit
- Journal title:
- Annu. Rev. Condens. Matter Phys.
- Year:
- 2010
- Pages contribution:
- 237-255
- Fulltext / DOI:
- doi:10.1146/annurev-conmatphys-070909-104034
- Publisher:
- Annual Reviews
- Date of publication:
- 10.08.2010
BibTeX