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Title:

X‐ray Interferometry with Two‐Dimensional Gratings

Document type:
Zeitschriftenaufsatz
Author(s):
Zanette, I.; Rutishauser, S.; David, C.; Weitkamp, T.
Journal title:
AIP Conference Proceedings
Year:
2011
Journal volume:
1365
Pages contribution:
325-328
Fulltext / DOI:
doi:10.1063/1.3625370
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