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- Title:
Probing the Spatial Homogeneity of Exfoliated HfTe5 Films
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Singh, MaanwinderP. ; Dong, Qingxin ; Chen, Gen-Fu ; Holleitner, Alexander W. ; Kastl, Christoph
- Keywords:
- Article ; van der Waals materials ; Raman microscopy ; strain ; topological insulator ; disorder
- Journal title:
- ACS Nano
- Year:
- 2024
- Journal volume:
- 18
- Journal issue:
- 28
- Pages contribution:
- 18327-18333
- Fulltext / DOI:
- doi:10.1021/acsnano.4c02081
- Publisher:
- American Chemical Society
- E-ISSN:
- 1936-0851 ; 1936-086X
- Date of publication:
- 03.07.2024
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