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Title:

Multispectral Microscopic Multiplexed (3m) Imaging of Atomically-Thin Crystals Using Deep Learning

Document type:
Zeitschriftenaufsatz
Author(s):
Dong, Xingchen ; Li, Hongwei ; Wang, Kun ; Menze, Bjoern ; Jakobi, Martin ; Yetisen, Ali K. ; Koch, Alexander W.
Keywords:
Research Article ; Research Articles ; atomically thin materials ; deep learning ; image restoration ; layer number identification ; multispectral imaging
Journal title:
Advanced Optical Materials
Year:
2023
Journal volume:
12
Journal issue:
2
Fulltext / DOI:
doi:10.1002/adom.202300860
E-ISSN:
2195-1071
Date of publication:
18.06.2023
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