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Title:

Revealing the Negative Capacitance Effect in Silicon Quantum Dot Light-Emitting Diodes via Temperature-Dependent Capacitance-Voltage Characterization

Document type:
Zeitschriftenaufsatz
Author(s):
Mock, J.; Kallergi, M.; Gros, E.; Golibrzuch, M.; Rieger, B.; Becherer, M.
Journal title:
IEEE Photonics Journal
Year:
2022
Journal volume:
14
Journal issue:
4
Pages contribution:
1-9
Fulltext / DOI:
doi:10.1109/jphot.2022.3184401
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
E-ISSN:
1943-06551943-0647
Date of publication:
01.08.2022
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