Ultrafast hot-carrier relaxation in silicon monitored by phase-resolved transient absorption spectroscopy

Titel:: Ultrafast hot-carrier relaxation in silicon monitored by phase-resolved transient absorption spectroscopy
Dokumenttyp:: Zeitschriftenaufsatz
Autor(en):: Wörle, Martin; Holleitner, Alexander W.; Kienberger, Reinhard; Iglev, Hristo
Zeitschriftentitel:: Physical Review B
Jahr:: 2021
Band / Volume:: 104
Heft / Issue:: 4
Volltext / DOI:: doi:10.1103/physrevb.104.l041201
Verlag / Institution:: American Physical Society (APS)
E-ISSN:: 2469-99502469-9969
Publikationsdatum:: 12.07.2021
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