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Title:

Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry

Document type:
Zeitschriftenaufsatz
Author(s):
Ansari, Homa; De Zan, Francesco; Parizzi, Alessandro
Journal title:
IEEE Transactions on Geoscience and Remote Sensing
Year:
2021
Journal volume:
59
Journal issue:
2
Pages contribution:
1285-1301
Fulltext / DOI:
doi:10.1109/tgrs.2020.3003421
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
E-ISSN:
0196-28921558-0644
Date of publication:
01.02.2021
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