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Title:

Deep Phenotyping of Yield-Related Traits in Wheat

Document type:
Zeitschriftenaufsatz
Author(s):
Prey, Lukas; Schmidhalter, Urs
Journal title:
Agronomy
Year:
2020
Journal volume:
10
Journal issue:
4
Pages contribution:
603
Fulltext / DOI:
doi:10.3390/agronomy10040603
Publisher:
MDPI AG
E-ISSN:
2073-4395
Date of publication:
23.04.2020
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