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Title:

Measurement of QCM Mass Sensitivity Based on Electrodeposition

Document type:
Konferenzbeitrag
Author(s):
Hu, Jianguo; Huang, Xianhe; Hu, Jianguo; Knoll, Alois
Pages contribution:
1-2
Book / Congress title:
2020 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)
Publisher:
IEEE
Date of publication:
16.10.2020
Year:
2020
Fulltext / DOI:
doi:10.1109/asemd49065.2020.9276091
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