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Title:

Signal-to-thickness calibration and pixel-wise interpolation for beam-hardening artefact reduction in microCT

Document type:
Article
Author(s):
Gustscin, N.; Gustschin, A.; Epple, F. M.; Allner, S.; Achterhold, K.; Herzen, J.; Pfeiffer, F.
Abstract:
X-ray computed tomography (CT) reconstruction suffers from beam-hardening arte facts caused by the polychromaticity of virtually all lab-based X-ray sources. A method to correct for beam-hardening is a direct, pixel-wise signal-to-thickness calibration (STC). We compare reconstructions of conventionally flat-field corrected as well as STC preprocessed measurements of various samples performed on a commercial microCT device based on a flat-panel detector. We show that a good estimate between the...     »
Journal title abbreviation:
Europhys Lett
Year:
2019
Journal volume:
125
Journal issue:
3
Fulltext / DOI:
doi:10.1209/0295-5075/125/38003
Print-ISSN:
0295-5075
TUM Institution:
Institut für Diagnostische und Interventionelle Radiologie
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