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Titel:

Closing the Gap Between Speed and Configurability of Multi-Bit Fault Emulation Environments for Security and Safety-Critical Designs

Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Vortrag / Präsentation
Autor(en):
Nyberg, Ralph and Nolles, Jürgen and Heyszl, Johann and Rabe, Dirk and Sigl, Georg
Abstract:
Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount of multi-bit fault occurrences, e.g., during fault attacks against cryptographic implementations. Therefore, multi-bit fault injection becomes more important during security and safety verification. Fault injection techniques which are applicable during the development cycle of a device are based on either software implementations, e.g. formal methods and simulations, or fault emulation environm...     »
Dewey-Dezimalklassifikation:
620 Ingenieurwissenschaften
Kongress- / Buchtitel:
EUROMICRO Conference on Digital System Design (DSD)
Kongress / Zusatzinformationen:
Verona, Italien
Jahr:
2014
Quartal:
3. Quartal
Jahr / Monat:
2014-08
Monat:
Aug
Reviewed:
ja
Sprache:
en
WWW:
http://esd.scienze.univr.it/dsd-seaa-2014/
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