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Title:

Cross-Layer Dependability Modeling and Abstraction in Systems on Chip

Author(s):
Herkersdorf, Andreas; Engel, Michael; Glaß, Michael; Henkel, Jörg; Kleeberger, Veit B.; Kochte, Michael A.; Kühn, Johannes M.; Nassif, Sani R.; Rauchfuss, Holm; Rosenstiel, Wolfgang; Schlichtmann, Ulf; Shafique, Muhammad; Tahoori, Mehdi B.; Teich, Jürgen; Wehn, Norbert; Weis, Christian; Wunderlich, Hans-Joachim
Book / Congress title:
Workshop on Silicon Errors in Logic - System Effects (SELSE)
Year:
2013
Month:
mar
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