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- Title:
Cross-Layer Dependability Modeling and Abstraction in Systems on Chip
- Author(s):
- Herkersdorf, Andreas; Engel, Michael; Glaß, Michael; Henkel, Jörg; Kleeberger, Veit B.; Kochte, Michael A.; Kühn, Johannes M.; Nassif, Sani R.; Rauchfuss, Holm; Rosenstiel, Wolfgang; Schlichtmann, Ulf; Shafique, Muhammad; Tahoori, Mehdi B.; Teich, Jürgen; Wehn, Norbert; Weis, Christian; Wunderlich, Hans-Joachim
- Book / Congress title:
- Workshop on Silicon Errors in Logic - System Effects (SELSE)
- Year:
- 2013
- Month:
- mar
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