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Titel:

Differential Scan-Path: A Novel Solution for Secure Design-for-Testability

Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Vortrag / Präsentation
Autor(en):
Manich, Salvador and Wamser, Markus Guillen, Oscar and Sigl, Georg
Abstract:
In this paper, we present a new scan-path structure for improving the security of systems including scan paths, which normally introduce a security critical information leak channel into a design. Our structure, named differential scan path (DiSP), divides the internal state of the scan path in two sections. During the shift-out operation, only subtraction of the two sections is provided. Inferring the internal state from this subtraction requires much guesswork that increases exponen-tially wit...     »
Stichworte:
security, testability, scan path, attack, BILBO
Dewey-Dezimalklassifikation:
620 Ingenieurwissenschaften
Kongress- / Buchtitel:
Test Conference (ITC), 2013 IEEE International
Kongress / Zusatzinformationen:
Anaheim, USA
Verlag / Institution:
IEEE
Jahr:
2013
Jahr / Monat:
2013-09
Monat:
Sep
Seiten:
1 - 9
Print-ISBN:
1089-3539
Reviewed:
ja
Sprache:
en
Volltext / DOI:
doi:10.1109/TEST.2013.6651902
WWW:
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6651902
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