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- Title:
Test structures for SRAM cell and device variability and the statistics of NBTI degradation
- Document type:
- Konferenzbeitrag
- Contribution type:
- Vortrag / Präsentation
- Author(s):
- Fischer, Thomas; Amirante, Ettore; Hofmann, Karl; Ostermayr, Martin; Huber, Peter; Schmitt-Landsiedel, Doris
- Book / Congress title:
- Workshop on Variation Test Structures at ICCAD
- Congress (additional information):
- San Jose, USA
- Date of publication:
- 13.11.2008
- Year:
- 2008
- Language:
- en
- TUM Institution:
- Lehrstuhl für Technische Elektronik
- Format:
- Text
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