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Title:

Test structures for SRAM cell and device variability and the statistics of NBTI degradation

Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Fischer, Thomas; Amirante, Ettore; Hofmann, Karl; Ostermayr, Martin; Huber, Peter; Schmitt-Landsiedel, Doris
Book / Congress title:
Workshop on Variation Test Structures at ICCAD
Congress (additional information):
San Jose, USA
Date of publication:
13.11.2008
Year:
2008
Language:
en
TUM Institution:
Lehrstuhl für Technische Elektronik
Format:
Text
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