"Laser Deflection Measurement for the Determination of Temperature and Charge Carrier Distributions in 4H-SiC Power Diodes"

Titel:: "Laser Deflection Measurement for the Determination of Temperature and Charge Carrier Distributions in 4H-SiC Power Diodes"
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Werber, D. ; Wachutka, G.
Seitenangaben Beitrag:: pp. 267-270
Kongress- / Buchtitel:: 7th European Conference on Silicon Carbide and Related Materials -ECSCRM 2008
Kongress / Zusatzinformationen:: Sept. 7-11, 2008, Barcelona, Spain
Jahr:: 2008
Sprache:: en
Format:: Text
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