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- Title:
"Testing semiconductor devices at extremly high operating temperatures"
- Document type:
- Konferenzbeitrag
- Author(s):
- Borthen, P.; Wachutka, G.
- Book / Congress title:
- Proceedings of the 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF -
- Congress (additional information):
- Sept. 29 to Oct. 2, 2008, Maastricht, The Netherlands
- Year:
- 2008
- Reviewed:
- ja
- Language:
- en
- Publication format:
- CD-ROM / DVD
- Semester:
- SS 08
- Format:
- Text
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