In the thin film geometry reflectivity measurements are a widespread technique to determine the density profile perpendicular to the sample surface. From off-specular scattering additional information about the surface roughness, lateral correlations, sizes and shapes of objects (particles, nanostructures) positioned on top of the surface or in a surface near region are accessible. The use of a grazing incidence geometry enhances the surface sensitivity. Grazing incidence small-angle scattering (GISAS) overcomes the limitations of conventional smallangle scattering with respect to extremely small sample volumes in the thin film geometry. Although real space analysis techniques such as scanning force microscopy (SFM) enable an easy access to surface structures, reciprocal space analysis techniques such as GISAS with X-Rays and neutrons include several advantages:      «

In the thin film geometry reflectivity measurements are a widespread technique to determine the density profile perpendicular to the sample surface. From off-specular scattering additional information about the surface roughness, lateral correlations, sizes and shapes of objects (particles, nanostructures) positioned on top of the surface or in a surface near region are accessible. The use of a grazing incidence geometry enhances the surface sensitivity. Grazing incidence small-angle scattering...     »