Login
- Document type:
- Konferenzbeitrag
- Author(s):
- Knapp, Josef; Morelli, Roberto; Eibert, Thomas F.
- Title:
- Accurate {Far}-field {Pattern} {Reconstruction} from {Near}-field {Meaurements} with {Inconvenient} {Probes}
- Book / Congress title:
- Progress {In} {Electromagnetic} {Research} {Symposium} ({PIERS})
- Publisher address:
- Toyama, Japan
- Year:
- 2018
- Month:
- aug
BibTeX